Publications - Proceedings

F.J. de Heer: Collisions between multiply charged ions and atoms resulting in radiation and autoionization In: Electronic and Atomic Collisions : Proceedings of the XIth International Conference on the Physics of Electronic and Atomic Collisions, Kyoto, 29 August-4 September 1979 : Invited Papers and Progress Reports /ed. N. Oda and K. Takayanagi, North-Holland, 1980. - pp. 427-436

M. Szymonski, U. Paschke, R. Pedrys, R.A. Haring, H.E. Roosendaal, F.W. Saris and A.E. de Vries: The energy distribution of molecules sputtered from frozen SF6 In: Molecular ScatteringSymposium on Sputtering : Proceedings of the Symposium on Sputtering Perchtoldsdorf/Wien, Austria 1980 April 28-30 /ed. P. Varga, G. Betz and F.P. Viehb, Institut für Allgemeine Physik, 1980. - pp. 312-319

F.J. de Heer: Experiments on electron capture and ionization by ions In: Atomic and Molecular Processes in Controlled Thermonuclear Fusion, Lectures presented at the NATO Advanced Study Institute on Atomic and Molecular Processes in Controlled Thermonuclear Fusion, held at Chateau de Bonas, Castéra-Verduzan, Gers, France, Aug /ed. M.R.C. McDowell and A.M. Ferendeci, Plenum Press, 1980. - pp. 351-390

A.E. de Vries: Energy distributions of sputtered neutral particles by ion bombardment In: Symposium on Sputtering : Proceedings of the Symposium on Sputtering Perchtoldsdorf/Wien, Austria 1980 April 28-30 /ed. P. Varga, G. Betz and F.P. Viehb, Institut für Allgemeine Physik, 1980. - pp. 256-279

D. Hoonhout and F.W. Saris: Segregation effects in pulsed laser annealing of ion-implanted silicon In: Laser and Electron Beam Processing of Materials : Papers presented at the Symposium on "Laser and Electron Beam Processing of Materials," held in Cambridge, Mass., November 27-30, 1979 /ed. C.W. White and P.S. Peercy, Academic Press, 1980. - pp. 137-142

P.G. Kistemaker, M.M.J. Lens, G.J.Q. van der Peyl and A.J.H. Boerboom: Laser induced desorption mass spectrometry In: Proceedings of the 8th International Mass Spectrometry Conference held at Oslo, 12-18 August 1979 /ed. A. Quayle, Heyden, 1980. - pp. 928-934

I.V. Mitchell, W.N. Lennard and J.-B. Sanders: Quantitative microanalysis by heavy ion beam induced x-ray excitation In: Ion Beam Analysis : Proceedings of the Fourth International Conference on Ion Beam Analysis, Aarhus, June 25-29, 1979 /ed. H.H. Andersen, J. Bottiger and H. Knudsen, North-Holland, 1980. - pp. 121-123

P.G. Kistemaker, G.J.Q. van der Peyl, A.J.H. Boerboom and J.R. Haverkamp: Laser desorption mass spectrometry of organic molecules In: 28th Annual Conference on Mass Spectrometry and Allied Topics, May 25-30, 1980, Waldorf Astoria Hotel, American Society for Mass Spectrometry, 1980. - pp. 652-653

H.E. Roosendaal and J.-B. Sanders: Anisotropy effects in the energy and angular distribution of sputtered particles In: Symposium on Sputtering : Proceedings of the Symposium on Sputtering Perchtoldsdorf/Wien, Austria 1980 April 28-30 /ed. P. Varga, G. Betz and F.P. Viehb, Institut für Allgemeine Physik, 1980. - pp. 302-311

J. Verhoeven: Electron impact effects on the absorption and desorption of gases on a solid surface: a review In: Proceedings of the fourth Seminar on Surface Physics, Wrocław-Trzebieszowice 1979 /ed. R. Meclewski, Wydawnictwa Uniwersytetu Wrocławskiego, 1980. - pp. 135-151