Publications - Proceedings

E. Wittendorp-Rechenmann, R.V. Rechenmann, B. Senger and J.-B. Sanders: Secondaires lourds energetiques - influence sur les parcours de particules a d'energies moyennes In: Radiation Protection : Proceedings : Fourth Symposium on Neutron Dosimetry, Munich-Neuherberg, 1-5 June 1981 /ed. G. Burger and H.G. Ebert, Commission of the European Communities, 1981. - pp. 317-326

F.W. Saris: Channelling studies of defect-impurity interactions of silicon In: Defects and Radiation Effects in Semiconductors, 1980 : Invited and Contributed Papers from the Eleventh International Conference on Defects and Radiation Effects in Semiconductors held in Oiso, Japan, 8-11 September 1980 /ed. R.R. Hasiguti, Institute of Physics, 1981. - pp. 111-122

P. Massmann, P.J.M. van Bommel, E.H.A. Granneman, H.J. Hopman, J.H. Los, F. Siebenlist and J.N.M. van Wunnik: Production of negative deuterium ion beams by means of negative surface ionization In: Tenth European Conference on Controlled Fusion and Plasma Physics, Moscow, September 14-19, 1981, Vol. 1 : Contributed Papers, European Physical Society, 1981.

J. Kistemaker: Some topics about ionization in gases and solids In: Proceedings of the VII International Conference on Atomic Collisions in Solids, Moscow, September 19-23, 1977, Vol. 1, Moscow State University, 1981. - pp. 149-154

G.C.A.M. Janssen, P.H. de Haan and H.J. Hopman: Plasma heating by a relativistic electron beam In: High-Power Beams 81 : Proceedings of the 4th International Topical Conference on High-Power Electron and Ion-Beam Research and Technology, Palaiseau, June 29-July 3, 1981 /ed. H.J. Doucet and J.M. Buzzi, L'Ecole, 1981. - pp. 575-581

D. Hoonhout and F.W. Saris: Threshold energy density for pulsed laser annealing of silicon In: Laser and Electron-Beam Solid Interactions and Materials Processing : Proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. /ed. J.F. Gibbons, L.D. Hess and T.W. Sigmon, North Holland, 1981. - pp. 31-37

A.E. de Vries: Energy distributions of sputtered neutral particles by ion bombardment In: Symposium on Sputtering : Proceedings of the Symposium on Sputtering Perchtoldsdorf/Wien, Austria 1980 April 28-30 /ed. P. Varga, G. Betz and F.P. Viehb, Institut für Allgemeine Physik, 1980. - pp. 256-279

D. Hoonhout and F.W. Saris: Segregation effects in pulsed laser annealing of ion-implanted silicon In: Laser and Electron Beam Processing of Materials : Papers presented at the Symposium on "Laser and Electron Beam Processing of Materials," held in Cambridge, Mass., November 27-30, 1979 /ed. C.W. White and P.S. Peercy, Academic Press, 1980. - pp. 137-142

P.G. Kistemaker, M.M.J. Lens, G.J.Q. van der Peyl and A.J.H. Boerboom: Laser induced desorption mass spectrometry In: Proceedings of the 8th International Mass Spectrometry Conference held at Oslo, 12-18 August 1979 /ed. A. Quayle, Heyden, 1980. - pp. 928-934

I.V. Mitchell, W.N. Lennard and J.-B. Sanders: Quantitative microanalysis by heavy ion beam induced x-ray excitation In: Ion Beam Analysis : Proceedings of the Fourth International Conference on Ion Beam Analysis, Aarhus, June 25-29, 1979 /ed. H.H. Andersen, J. Bottiger and H. Knudsen, North-Holland, 1980. - pp. 121-123