Transmission Electron Microscope (TEM)

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AMOLF acquired a unique instrument: a Transmission Electron Microscope (TEM). With this microscope researchers can now watch materials at the atomic scale and see what is happening over time and under the influence of light. This microscope is open to everyone with an academic or industrial affiliation at an hourly fee.

 

Technical specifications

The ‘JEOL NeoARM TEM ‘combines high resolution electron imaging with light incoupling. Together with synchronized beam blanking, 4D-STEM and EDX this systems provides a powerful platform for research.

Here are its technical specifications:

  • JEOL NeoARM TEM
  • Cold Field Emission Gun (CFEG, 0.3eV FWHM energy spread)
  • Wide Gap Configuration, STEM ASCOR Cs corrector (TEM 0.14nm resolution, STEM 0.082nm resolution)
  • IDES Laser Incoupling (NKT SuperK laser with tunable filter, setup can be modified depending on application)
  • HR(S)TEM
  • STEM detectors
    • ABF, ADF, BF, HAADF
    • STEM Lorentz (SAAF)
  • JEOL DrySD100GV EDX (100mm2, windowless, 133eV@Mnka)
  • Synchrony beam blanking (down to 50 ns electron pulses)
  • ASI 4D-STEM detector (event-driven direct electron detector with 1.56 ns resolution)
  • TVIPS XF416 R(ES) TEM Camera bottom mounted camera (48 fps @ 4k x 4k; up to 384 fps @ 512 x 1k)

In-take procedure

In order to help you with your training and measurements, we would like to learn more about your project. The in-take procedure follow the steps below to make the process as smooth as possible:

  1. Send an email to support.nanolab@amolf.nl with these specifics:
    • A technical description of your sample(s) including:
      • What do you want to know about your sample?
      • What is the sample made of? What are the dimensions (thickness, nanoparticle size etc.) of the sample?
      • What TEM grids are used?
      • How are the samples prepared and cleaned?
      • How many samples do you have?
      • How often should these measurements be repeated?
      • Other features which are important to your sample or measurement.
    • Which institute or company (and department) are you from?
    • Specifically mention that you are applying for the TEM.
  2. An in-take interview will be planned with the Nanolab staff and the responsible TEM technician or operator. During this interview the specifics of the project will be discussed.
  3. After the in-take interview, the training(s) or measurement will be planned. The duration of a training depends on the complexity of the measurements.
  4. After the training has been completed reservations can be made on nis.nanolabnl.nl. The training staff will give you access to make reservations for the TEM independently.

TEM facility user rates

For the TEM facility, two rates are distinguished:

  1. Public Rate

Users from public research communities e.g. Universities, NWO, etc.

  1. Private Rate

Other users, private parties

Cost Item (per person) Public User (€) Private User (€)
Rate for the microscope per hour 100 ex BTW 200 ex BTW
Rate for the operator per hour 80 ex BTW 160 ex BTW

Please note that these rates are different from the AMOLF Nanolab Amsterdam user rates. The TEM facility is supported by the Nanolab, but is considered a separate facility.

Contact

Are you interested or do you have questions? Then send an email message to support.nanolab@amolf.nl.

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