• G.C.A.M. Janssen, P.H. de Haan and H.J. Hopman: Plasma heating by a relativistic electron beam In: High-Power Beams 81 : Proceedings of the 4th International Topical Conference on High-Power Electron and Ion-Beam Research and Technology, Palaiseau, June 29-July 3, 1981 /ed. H.J. Doucet and J.M. Buzzi, L'Ecole, 1981. - pp. 575-581

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  • D. Hoonhout and F.W. Saris: Threshold energy density for pulsed laser annealing of silicon In: Laser and Electron-Beam Solid Interactions and Materials Processing : Proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. /ed. J.F. Gibbons, L.D. Hess and T.W. Sigmon, North Holland, 1981. - pp. 31-37

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  • A.E. de Vries: Energy distributions of sputtered neutral particles by ion bombardment In: Symposium on Sputtering : Proceedings of the Symposium on Sputtering Perchtoldsdorf/Wien, Austria 1980 April 28-30 /ed. P. Varga, G. Betz and F.P. Viehb, Institut für Allgemeine Physik, 1980. - pp. 256-279

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  • D. Hoonhout and F.W. Saris: Segregation effects in pulsed laser annealing of ion-implanted silicon In: Laser and Electron Beam Processing of Materials : Papers presented at the Symposium on "Laser and Electron Beam Processing of Materials," held in Cambridge, Mass., November 27-30, 1979 /ed. C.W. White and P.S. Peercy, Academic Press, 1980. - pp. 137-142

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  • P.G. Kistemaker, M.M.J. Lens, G.J.Q. van der Peyl and A.J.H. Boerboom: Laser induced desorption mass spectrometry In: Proceedings of the 8th International Mass Spectrometry Conference held at Oslo, 12-18 August 1979 /ed. A. Quayle, Heyden, 1980. - pp. 928-934

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  • I.V. Mitchell, W.N. Lennard and J.-B. Sanders: Quantitative microanalysis by heavy ion beam induced x-ray excitation In: Ion Beam Analysis : Proceedings of the Fourth International Conference on Ion Beam Analysis, Aarhus, June 25-29, 1979 /ed. H.H. Andersen, J. Bottiger and H. Knudsen, North-Holland, 1980. - pp. 121-123

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  • P.G. Kistemaker, G.J.Q. van der Peyl, A.J.H. Boerboom and J.R. Haverkamp: Laser desorption mass spectrometry of organic molecules In: 28th Annual Conference on Mass Spectrometry and Allied Topics, May 25-30, 1980, Waldorf Astoria Hotel, American Society for Mass Spectrometry, 1980. - pp. 652-653

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  • H.E. Roosendaal and J.-B. Sanders: Anisotropy effects in the energy and angular distribution of sputtered particles In: Symposium on Sputtering : Proceedings of the Symposium on Sputtering Perchtoldsdorf/Wien, Austria 1980 April 28-30 /ed. P. Varga, G. Betz and F.P. Viehb, Institut für Allgemeine Physik, 1980. - pp. 302-311

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  • J. Verhoeven: Electron impact effects on the absorption and desorption of gases on a solid surface: a review In: Proceedings of the fourth Seminar on Surface Physics, WrocÅ‚aw-Trzebieszowice 1979 /ed. R. Meclewski, Wydawnictwa Uniwersytetu WrocÅ‚awskiego, 1980. - pp. 135-151

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  • G.J. Louter and A.J.H. Boerboom: Collision induced dissociation experiments using a tandem mass spectrometer with simultaneous detection: Specifications and some first experimental results In: Proceedings of the 8th International Mass Spectrometry Conference held at Oslo 12-18 August 1979 /ed. A. Quayle, Heyden, 1980. - pp. 1851-1858

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