| Reference |
F.W. Saris: Channelling studies of defect-impurity interactions of silicon In: Defects and Radiation Effects in Semiconductors, 1980 : Invited and Contributed Papers from the Eleventh International Conference on Defects and Radiation Effects in Semiconductors held in Oiso, Japan, 8-11 September 1980 /ed. R.R. Hasiguti, Institute of Physics, 1981. - pp. 111-122 |
