Publications - Photonic Materials

K.S. Min, K.V. Shcheglov, C.M. Yang, H.A. Atwater, M.L. Brongersma and A. Polman, The role of quantum-confined excitons vs defects in the visible luminescnence of SiO2 films containing Ge nanocrystals, Appl. Phys. Lett. 68, 2511-2513 (1996)

A. Polman, R. Serna, J.S. Custer and M. Lohmeier: Segregation and trapping of erbium in silicon at a crystal-amorphous or crystal-vacuum interface In: Rare Earth Doped Semiconductors II : Symposium held April 8-10, 1996, San Francisco, California, U.S.A. /ed. S. Coffa, A. Polman and R.N. Schwartz, Materials Research Society, 1996. - pp. 21-27

K.S. Min, K.V. Shcheglov, C.M. Yang, R.P. Camata, H.A. Atwater, M.L. Brongersma and A. Polman: On the origin of visible luminescence from SiO2 films containing nanocrystals In: Surface/Interface and Stress Effects in Electronic Materials Nanostructures, Materials Research Society, 1996. - pp. 247-252

J.H. Shin, R. Serna, G.N. van den Hoven, A. Polman, W.G.J.H.M. van Sark and A.J. Vredenberg, Luminescence quenching in erbium-doped hydrogenated amorphous silicon, Appl. Phys. Lett. 68, 997-999 (1996)

G.N. van den Hoven, E. Snoeks, A. Polman, C. van Dam, J.W.M. van Uffelen and M.K. Smit, Upconversion in Er-implanted Al2O3 waveguides, J. Appl. Phys. 79, 1258-1266 (1996)

F. Priolo, S. Coffa, G. Franzò and A. Polman: Excitation mechanisms and light emitting device performances in Er-doped crystalline Si In: Rare Earth Doped Semiconductors II : Symposium held April 8-10, 1996, San Francisco, California, U.S.A. /ed. S. Coffa, A. Polman and R.N. Schwartz, Materials Research Society, 1996. - pp. 305-316

G.N. van den Hoven, J.H. Shin, A. Polman, S. Lombardo and S.U. Campisano, Erbium in oxygen-doped silicon: optical excitation, J. Appl. Phys. 78, 2642-2650 (1995)

F. Priolo, G. Franzò, S. Coffa, A. Polman, S. Libertino, R.C. Barklie and D. Carey, The erbium-impurity interaction and its effects on the 1.54 µm luminescence of Er3+ in crystalline silicon, J. Appl. Phys. 78, 3874-3882 (1995)

E. Snoeks, A. Lagendijk and A. Polman, Measuring and modifying the spontaneous emission rate of erbium near an interface, Phys. Rev. Lett. 74, (13), 2459-2462 (1995)

G.N. van den Hoven, E. Snoeks, A. Polman, C. van Dam, J.W.M. van Uffelen and M.K. Smit: Optical gain in erbium-implanted Al2O3 waveguides In: ECIO '95 Proceedings 7th European Conference on Integrated Optics, April 3-6, 1995 Delft, The Netherlands : Regular and Invited Papers /ed. L. Shi, L.H. Spiekman and X.J.M. Leijtens, Delft University Press, 1995. - pp. 229-232