C.A. Volkert and A. Polman: Radiation-enhanced plastic flow of covalent materials during ion irradationIn: Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. /ed. G.S. Was, L.E. Rehn and D.M. Follstaedt, Materials Research Society, 1992. - pp. 3-14
A.G. Cullis, A. Polman, P.W. Smith, D.C. Jacobson, J.M. Poate and C.R. Whitehouse, The nature of keV and MeV ion damage in AlxGa1-xAs/GaAs and AlAs/GaAs heterostructures, Nucl. Instrum. Methods Phys. Res., Sect B 62, 463-468 (1992)
A. Polman, M.A. Marcus, D.C. Jacobson and J.M. Poate: Local structure around Er in MeV Er-implanted silicaIn: Optical Waveguide Materials : Symposium held December 2-4, 1991, Boston, Massachusette, U.S.A. /ed. M.M. Broer, G.H. Sigel, R.Th. Kersten and H. Kawazoe, Materials Research Society, 1992. - pp. 381-386
A.G. Cullis, D.C. Jacobson, A. Polman, P.W. Smith, J.M. Poate and C.R. Whitehouse: The energy dependence of ion damage in AlxGa1-xAs/GaAs heterostructures and the effects of implanted impurityIn: Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. /ed. G.S. Was, L.E. Rehn and D.M. Follstaedt, Materials Research Society, 1992. - pp. 229-234
S. Roorda, J.S. Custer, W.C. Sinke, J.M. Poate, D.C. Jacobson, A. Polman and F. Spaepen, Structural relaxation in amorphous silicon and the role of network defects, Nucl. Instrum. Methods Phys. Res., Sect B 59/60, 344-352 (1991)
J.M. Poate, S. Coffa, D.C. Jacobson, A. Polman, J.A. Roth, G.L. Olson, S. Roorda, W.C. Sinke, J.S. Custer, M.O. Thompson, F. Spaepen and E. Donovan, Amorphous Si - the role of MeV implantation in elucidating defect and thermodynamic properties, Nucl. Instrum. Methods Phys. Res., Sect B 55, 533-543 (1991)
P.A. Stolk, A. Polman and W.C. Sinke: Freezing in silicon at large undercoolingIn: Beam-Solid Interactions : Physical Phenomena : Symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A. /ed. J.A. Knapp, P. Borgesen and R.A. Zuhr, Materials Research Society, 1990. - pp. 363-368
A. Polman, P.A. Stolk, D.J.W. Mous, W.C. Sinke, C.W.T. Bulle-Lieuwma and D.E.W. Vandenhoudt, Pulsed-laser crystallization of amorphous silicon layers buried in a crystalline matrix, J. Appl. Phys. 67, 4024-4035 (1990)
A. Polman, D.C. Jacobson, S. Coffa, J.M. Poate, S. Roorda and W.C. Sinke, Defect states of amorphous Si probed by the diffusion and solubility of Cu, Appl. Phys. Lett. 57, 1230-1232 (1990)