J.S. Custer, E. Snoeks and A. Polman: Photoluminescence of erbium in amorphous silicon: Structural relaxation and optical dopingIn: Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. /ed. G.S. Was, L.E. Rehn and D.M. Follstaedt, Materials Research Society, 1992. - pp. 51-56
A. Polman, D.C. Jacobson and J.M. Poate: Erbium-defect interactions in silica films implanted with MeV Er ionsIn: Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. /ed. G.S. Was, L.E. Rehn and D.M. Follstaedt, Materials Research Society, 1992. - pp. 377-382
C.A. Volkert and A. Polman: Radiation-enhanced plastic flow of covalent materials during ion irradationIn: Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. /ed. G.S. Was, L.E. Rehn and D.M. Follstaedt, Materials Research Society, 1992. - pp. 3-14
A.G. Cullis, A. Polman, P.W. Smith, D.C. Jacobson, J.M. Poate and C.R. Whitehouse, The nature of keV and MeV ion damage in AlxGa1-xAs/GaAs and AlAs/GaAs heterostructures, Nucl. Instrum. Methods Phys. Res., Sect B 62, 463-468 (1992)
S. Roorda, J.S. Custer, W.C. Sinke, J.M. Poate, D.C. Jacobson, A. Polman and F. Spaepen, Structural relaxation in amorphous silicon and the role of network defects, Nucl. Instrum. Methods Phys. Res., Sect B 59/60, 344-352 (1991)
J.M. Poate, S. Coffa, D.C. Jacobson, A. Polman, J.A. Roth, G.L. Olson, S. Roorda, W.C. Sinke, J.S. Custer, M.O. Thompson, F. Spaepen and E. Donovan, Amorphous Si - the role of MeV implantation in elucidating defect and thermodynamic properties, Nucl. Instrum. Methods Phys. Res., Sect B 55, 533-543 (1991)
P.A. Stolk, A. Polman and W.C. Sinke: Freezing in silicon at large undercoolingIn: Beam-Solid Interactions : Physical Phenomena : Symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A. /ed. J.A. Knapp, P. Borgesen and R.A. Zuhr, Materials Research Society, 1990. - pp. 363-368
A. Polman, P.A. Stolk, D.J.W. Mous, W.C. Sinke, C.W.T. Bulle-Lieuwma and D.E.W. Vandenhoudt, Pulsed-laser crystallization of amorphous silicon layers buried in a crystalline matrix, J. Appl. Phys. 67, 4024-4035 (1990)
A. Polman, D.C. Jacobson, S. Coffa, J.M. Poate, S. Roorda and W.C. Sinke, Defect states of amorphous Si probed by the diffusion and solubility of Cu, Appl. Phys. Lett. 57, 1230-1232 (1990)