Publications - Proceedings

S. Roorda and W.C. Sinke: Defects, entropy, and melting of amorphous silicon In: Kinetics of Phase Transformations : Symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A. /ed. M.O. Thompson, M.J. Aziz and G.B. Stephenson, Materials Research Society, 1992. - pp. 9-14

F.W. Saris: Surface science and semiconductor processing In: Crucial Issues in Semiconductor Materials and Processing Technologies : Proceedings of the NATO Advanced Study Institute on Semiconductor Materials and Processing Technologies, Erice, Italy, 1-13 July 1991 /ed. S. Coffa, F. Priolo, E. Rimini and J.M. Poate, Kluwer, 1992. - pp. 147-152

J.S. Custer: The amorphous side of solid phase epitaxy In: Crucial Issues in Semiconductor Materials and Processing Technologies : Proceedings of the NATO Advanced Study Institute on Semiconductor Materials and Processing Technologies, Erice, Italy, 1-13 July 1991 /ed. S. Coffa, F. Priolo, E. Rimini and J.M. Poate, Kluwer Academic Publishers, 1992. - pp. 477-482

J.F. van der Veen, R. van Silfhout and A.W. Denier van der Gon: Ion and X-ray scattering studies of surface disorder In: Ordering at Surface and Interfaces : Proceedings of the Third NEC Symposium, Hakone, Japan, October 7-11, 1990 /ed. A. Yoshimori, T. Shinjo and H. Watanabe, Springer-Verlag, 1992. - pp. 3-12

E.J. Puik, S.W.M. van de Ven, W.J.J. Wolfis, G.E. van Dorssen, M.J. van der Wiel, R.J.I.M. Koper, H. Zeijlemaker and J. Verhoeven: Two methods to improve the optical quality of Ni-C multilayer coatings: Ion bombardment and optimization of the substrate temperature In: Multilayer Optics for Advanced X-ray Applications : 22-23 July 1991, San Diego, California /ed. N.M. Ceglio, Bellingham: SPIE, 1992. - pp. 221-227

R. Hemsworth, H.J. Hopman, C. Jacquot, J. Pamela and A.J.T. Holmes: The European programme on negative ion beam development In: IAEA Technical Committee Meeting on Negative Ion Based Neutral Beam Injectors, Japan Atomic Energy Research Institute, Naka, Ibaraki-ken, Japan, November 11-13, 1991, [s.n.], 1992. - pp. 30-33

G. Israel, E. Chassefi, H.B. Niemann, J.J. Boon, F. Raulin, M. Cabane and C. Sabl: Huygens/ACP: An instrument for aerosols chemical composition measurements. In: Symposium on Titan : Proceedings : Toulouse, France, 9-12 September 1991 /ed. B. Kaldeich, ESA, 1992. - pp. 225-228

M.B. van der Mark and A. Lagendijk: Observation of light scattering from single cylinders: some remarkable conclusions In: Huygens' Principle 1690-1990 : Theory and Applications : Proceedings of an International Symposium The Hague/Scheveningen, November 19-22, 1990 /ed. H. Blok, H.A. Ferweda and H.K. Kuiken, North-Holland, 1992. - pp. 509-520

S. Roorda, R.A. Hakvoort, A. van Veen, P.A. Stolk and F.W. Saris: Vacancy-type and electrical defects in amorphous silicon probed by positrons and electrons In: Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. /ed. G.S. Was, L.E. Rehn and D.M. Follstaedt, Materials Research Society, 1992. - pp. 39-44

W.H. de Jeu: Microscopic aspects of the nematic phases In: Phase Transitions in Liquid Crystals : Proceedings of a NATO Advanced Study Institute/16th Course of the International School of Quantum Electronics on Phase Transitions in Liquid Crystals, held May 2-12, 1991, in Erice, Sicily, Italy /ed. S. Martellucci and A.N. Chester, Plenum Press, 1992. - pp. 17-27