Publications - Proceedings

J.E. MacDonald, A.A. Williams, J.M.C. Thornton, R. van Silfhout, J.F. van der Veen, M.S. Finney and C. Norris: Grazing incidence X-ray diffraction studies of strain relaxation in monolayer-thick films In: Microscopy of Semiconducting Materials 1991 : Proceedings of the Institute of Physics Conference, held at Oxford University, 25-28 march 1991 /ed. A.G. Cullis and N.J. Long, Institute of Physics, 1991. - pp. 645-650

E. Vlieg, I.K. Robinson and J.F. van der Veen: X-ray diffraction from surfaces and interfaces: Atomic structure and morphology In: Advances in Surface and Thin Film Diffraction : Symposium held in November 27-29, 1990, Boston, Massachusetts, U.S.A. /ed. T.C. Huang, P.I. Cohen and D.J. Eaglesham, Material Research Society, 1991. - pp. 169-177

J.G. Bannenberg, W.H. Urbanus, R.-G.C. Wojke, H. Klein, R.W. Thomae, A. Schempp, T. Weis and P.W. van Amersfoort: MEQALAC: A 1 MeV multichannel rf accelerator for nitrogen ions In: Proceedings of the 1990 Linear Accelerator Conference, September 10-14, 1990 Albuquerque, New Mexico, Los Alamos National Laboratory, 1991. - pp. 250-252

H.G. Muller, P.H. Bucksbaum, A. Zavriyev and D.W. Schumacher: Softening of the molecular bond in intense laser fields In: Atomic Physics 12 : Twelfth International Conference on Atomic Physics, Ann Arbor, Michigan 1990 /ed. R.R. Lewis, American Institute of Physics, 1991. - pp. 325-335

P.-P. Michiels, L.A. Verhoef, R.J.C. van Zolingen, W.C. Sinke, C.M.M. Denisse and M. Hendriks: Van 11 naar 13.5 % rendement op paneelniveau bij R&S In: Het Perspectief van Zonne-energie : Conferentieverslag /ed. W.C. Turkenburg, ISES Nederland, 1991. - pp. 125-129

S.D. Peteves, H. Jensen, G. Sorensen and A.J. Vredenberg: Effects of ion implantation on the mechanical properties of silicon nitride ceramics In: High Performance Ceramic Films and Coatings : Proceedings of the Satellite Symposium 1 on High Performance Ceramic Films and Coatings of the 7th International Meeting on Modern Ceramics Technologies (7th CIMTEC-World Ceramics Congress), Montecatini Terme,, Elsevier B.V., 1991. - pp. 553-564

J. Vrijmoeth, P.M. Zagwijn, J.W.M. Frenken and J.F. van der Veen: Structure determination of the NiSi2(111) surface using medium energy ion scattering with monolayer resolution In: Advances in Surface and Thin Film Diffraction : Symposium held in November 27-29, 1990, Boston, Massachusetts, U.S.A. /ed. T.C. Huang, P.I. Cohen and D.J. Eaglesham, Material Research Society, 1991. - pp. 199-202

R. Hoekstra, F.J. de Heer and R. Morgenstern: l-State selective charge exchange cross sections for collisions of He2+ on atomic and molecular hydrogen In: The Physics of Electronic and Atomic Collisions : XVI International Conference, New York, NY 1989 /ed. A. Dalgarno, R.S. Freund, P.M. Koch, M.S. Lubell and T.B. Lucatorto, American Institute of Physics, 1990. - pp. 390-395

A.J.F. den Boggende, M.P. Bruijn, J. Verhoeven, H. Zeijlemaker, E.J. Puik and H.A. Padmore: A broad band multilayer coated blazed grating for X-ray wavelengths below 0.6 nm In: Advanced X-ray/EUV Radiation Sources and Applications : 11-13 July 1990, San Diego, California /ed. J.P. Knauer and G.K. Shenoy, Bellingham: SPIE, 1990. - pp. 189-197

S. Roorda, W.C. Sinke, J.M. Poate, D.C. Jacobson, P. Fuoss, S. Dierker, B.S. Dennis and F. Spaepen: Thermodynamic and structural properties of MeV ion beam amorphized silicon In: Beam-Solid Interactions : Physical Phenomena : Symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A. /ed. J.A. Knapp, P. Borgesen and R.A. Zuhr, Materials Research Society, 1990. - pp. 683-688