• F.J. de Heer, R. Hoekstra and H.P. Summers, New assessment of cross-section data for helium excitation by protons, Nucl. Fusion : Atom. Plasma-Mater. Interact. Data Fusion 3, 47-50 (1992)

    Read more

  • G.C.A.M. Mooij, D. Frenkel and B. Smit, Direct simulation of phase equilibria of chain molecules, J. Phys.: Condens. Matter 4, 255-259 (1992)

    Read more

  • T.M. Nieuwenhuizen, A. Lagendijk and B.A. van Tiggelen, Resonant point scatterers in multiple scattering of classical waves, Phys. Lett. A 169, 191-194 (1992)

    Read more

  • C. Norris, M.S. Finney, G.F. Clark, G. Baker, P.R. Moore and R. van Silfhout, Design and performance of a focused beam line for surface x-ray diffraction, Rev. Sci. Instrum. 63, 1083-1086 (1992)

    Read more

  • J. Verhoeven, L. Chunguang, E.J. Puik, M.J. van der Wiel and T.P. Huijgen, Ion beam modification of Mo-Si multilayer systems for X-ray reflection, Appl. Surf. Sci. 55, 97-103 (1992)

    Read more

  • Y.N. Erokhin, R. Grotzschel, S.R. Oktyabrsky, S. Roorda, W.C. Sinke and A.F. Vyatkin, Mesotaxy by nickel diffusion into a buried amorphous silicon layer, Mater. Sci. Eng. B 12, 103-106 (1992)

    Read more

  • G.J. Niemann, J.B.M. Pureveen, G.B. Eijkel, H. Poorter and J.J. Boon, Differences in relative growth rate in 11 grasses correlate with differences in chemical composition as determined by pyrolysis mass spectrometry, Oecologia 89, 567-573 (1992)

    Read more

  • J.P.M. Beijers, R. Hoekstra, R. Morgenstern and F.J. de Heer, State-selective electron capture and core excitation in slow Ne6+-He collisions, J. Phys. B: At., Mol. Opt. Phys. 25, 4851-4864 (1992)

    Read more

  • B. Tjipto-Margo, G.T. Evans, M.P. Allen and D. Frenkel, Elastic constants of hard and soft nematic liquid crystals, J. Phys. Chem. 96, 3942-3948 (1992)

    Read more

  • A.J.H. Boerboom and M.I. Yavor, The influence of small imperfections in inhomogeneous magnetic sector fields on ion trajectories and focussing properties, Int. J. Mass Spectrom. Ion Processes 120, 65-70 (1992)

    Read more