• M. Vanzan, S. Bertuletti, G. Becatti, B. Bazan, M.T. Rispens, S.I.C. Wan, M. Leeman, W.L. Noorduin and F. Baletto, A Rational Framework to Estimate the Chiroptical Activity of [6]Helicene Derivatives, J. Phys. Chem. A, (2025)

    Read more

  • S.W. van Dongen, J. Maeda, B. Kaptein, P. Cardinael, A. Flood, G. Coquerel and W.L. Noorduin, Mechanistic Dissymmetry between Crystal Growth and Dissolution drives Ratcheted Chiral Amplification, J. Am. Chem. Soc., (2025)

    Read more

  • S. Fiedler, L. Monin, H. Sugimoto, M. Fujii, W. Albrecht and A. Polman, Nanoscale Heat Flow and Thermometry in Laser-Heated Resonant Silicon Mie Nanospheres Probed with Spatially Resolved Cathodoluminescence Spectroscopy, ACS Photonics, (2025)

    Read more

  • M. Schoettle, A.V. Mader and W.L. Noorduin, Colloidal Crack Sintering Lithography for Light‐Induced Patterning of Particle Assemblies, Adv. Funct. Mater., e20056: 1-9 (2025)

    Read more

  • E. Akerboom, H. Sugimoto, M. Fujii, F.J. García de Abajo and A. Polman, Angle-Resolved Cathodoluminescence Interferometry of Plasmonic and Dielectric Scatterers, Nano Lett. 25, (39), 14264-14269 (2025)

    Read more

  • M. Vennettilli, K. Ramachandran and A. Mugler, Near-critical gene expression in embryonic boundary precision, Phys. Rev. E 112, (3), 034410: 1-6 (2025)

    Read more

  • A. Das and P.R. ten Wolde, Exact Computation of Transfer Entropy with Path Weight Sampling, Phys. Rev. Lett. 135, (10), 107404: 1-9 (2025)

    Read more

  • C. Bösch, M. Serra-Garcia, C. Böhm and A. Fichtner, Adjoint computation of Berry phase gradients, J. Sound Vib. 619, 119357: 1-13 (2025)

    Read more

  • D. Krueger, W.K. Spoelstra, D.J. Mastebroek, R.N.U. Kok, S. WU, M. Nikolaev, M. Bannier-Hélaouët, N. Gjorevski, M. Lutolf, J.H. van Es, J.S. van Zon, S.J. Tans and H. Clevers, Epithelial tension controls intestinal cell extrusion, Science 389, (6764) (2025)

    Read more

  • F. Bijloo, A.J. den Boef, P.M. Kraus and A.F. Koenderink, Structure-in-Void Quasi-Bound State in the Continuum Metasurface for Deeply Subwavelength Nanostructure Metrology, ACS Nano 19, (36), 32082-32092 (2025)

    Read more