R. Hoekstra, J.P.M. Beijers, F.J. de Heer and R. Morgenstern, Simultaneous electron capture and target ion excitation in collisions of C4+ and N5+ on He, Z. Phys. D 25, 209-215 (1993)
A.M. Shedrinsky, D.A. Grimaldi, J.J. Boon and N.S. Baer, Application of pyrolysis-gas chromatography and pyrolysis-gas chromatography/mass spectrometry to the unmasking of amber forgeries, J. Anal. Appl. Pyrolysis 25, 77-95 (1993)
G.J. Niemann, G.B. Eijkel, H. Konings, J.B.M. Pureveen and J.J. Boon, Chemical differences between wildtype and gibberellin mutants of tomato determined by pyrolysis-mass spectrometry, Plant, Cell Environ. 16, 1059-1069 (1993)
J. O'Brien, Y. Ouchi, C. Stanners and Y.R. Shen, Bulk reorientation driven by orientational transition in liquid crystal monolayer, Phys. Rev. Lett. 71, 758-761 (1993)
A. Polman, J.S. Custer, E. Snoeks and G.N. van den Hoven, Optical doping of silicon with erbium by ion implantation, Nucl. Instrum. Methods Phys. Res., Sect B 80/81, 653-658 (1993)
NET Team, R. Toschi, F. Engelmann, E. Salpietro, C. Barnes, H.-W. Bartels, J. Basecq, K. Borrass, L. Bottura, F. Bourbon, M. Browne, P. Bruzzone, R. Bünde, A. Cardella, F. Casci, S. Chiocchio, O. de Barbieri, W. D'haeseleer, P. Dinner, E. Ebert, F. Fauser, G. Federici, F. Gervaise, W. Gulden, R. Harrison, H.J. Hopman, C. Holloway, P. Hubert, M. Iseli, R. Jakeman, H. Katheder, J. van der Laan, P. Lalousis, D. Leger, P. Lorenzetto, D. Maisonnier, G. Malavasi, R. Mestric, N. Mitchell, D. Murdoch, A. Nocentini, G. Pacher, H. Pacher, M. Perella, A. Portone, J. Raeder, L. Rebuffi, T. Reeve, D. Robinson, R. Shaw, M. Sironi, W. Spears, C. Vallone, G. Vieider, E. Villata, C. Wu and E. Zolti, NET Next European Torus: Predesign report, Fusion Eng. Des. 21, 1-358 (1993)
M.A. Hemminga, V.A. Klap, J. van Soelen and J.J. Boon, Effect of salt marsh inundation on estuarine particulate organic matter characteristics, Mar. Ecol. Prog. Ser. 99, 153-161 (1993)
J.E. MacDonald, J.M.C. Thornton, A.A. Williams, P. Ashu, C.C. Matthai, H.A. van der Vegt and E. Vlieg, Strain distribution during growth of Ge/Si(001) and the effect of surfactant layers, Scanning microsc. 7, 497-502 (1993)
