Publications - Proceedings

A.J.H. Boerboom: Round table on new developments and trends in mass spectrometry In: Proceedings of the 7th International Mass Spectrometry Conference held at Florence, 30 August to 3 September 1976 /ed. N.R. Daly, Heyden, 1978. - pp. 939-948

T. Matsuo, N. Takahashi, H. Matsuda and A.J.H. Boerboom: Application of quadrupole lenses to mass spectrometers In: Proceedings of the 7th International Mass Spectrometry Conference held at Florence, 30 August to 3 September 1976 /ed. N.R. Daly, Heyden, 1978. - pp. 851-854

J.G. Bannenberg, S. Doorn and F.W. Saris: A new accelerator for multiply charged ions at low energy In: Low-energy ion beams : conference proceedings /ed. K.G. Stephens, IoP, 1978. - pp. 63-69

J.H. Los: The dynamics of ion-pair forming collisions In: Electronic and Atomic Collisions : Proceedings of the 10th International Conference on the Physics of Electronic and Atomic Collisions, Paris, 21-27 July, 1977 : Invited Papers and Progress Reports /ed. G. Watel, North-Holland, 1978. - pp. 617-638

D. Hoonhout, Y. Tamminga, W.R. Garrett and F.W. Saris: The influence of the dopant and annealing of ion-implanted silicon with a ruby laser In: Proceedings of "Laser Effects in Ion Implanted Semiconductors", Catania, August 31 - September 2, 1978 /ed. E. Rimini, Istituto di Struttura della Materia Universit, 1978. - pp. 168-179

L.W. Wiggers and F.W. Saris: Displacement of group III, IV, V and VI impurities is Si by the analyzing beam In: Proceedings of the third International Conference on Ion Beam Analysis : Washington, D.C., June 27-July 1, 1977 /ed. E.A. Wolicki, J.W. Butler and P.A. Treado, North-Holland, 1978. - pp. 399-404

M. Gavrila: Free-free photoabsorption of electron-atom systems In: Electronic and Atomic Collisions : Proceedings of the 10th International Conference on the Physics of Electronic and Atomic Collisions, Paris, 21-27 July, 1977 : Invited Papers and Progress Reports /ed. G. Watel, North-Holland, 1978. - pp. 165-184

H.L.C. Meuzelaar: Pyrolysis Mass Spectrometry: Prospects for Interlaboratory Standardization In: Proceedings 26th ASMS Conference, St. Louis May - June 1978, , 1978. - pp. 1-13

D. Hoonhout, C.B.W. Kerkdijk, R.S. Bhattacharya, H.H. Kersten, W.C. Turkenburg and F.W. Saris: Surface layer analysis by MEIS using a solid state detector In: Proceedings of the Third International Conference on Ion Beam Analysis : Washington, D.C., June 27-July 1, 1977 /ed. E.A. Wolicki, J.W. Butler and P.A. Treado, North-Holland, 1978. - pp. 355-360

A.J.H. Boerboom, P.G. Kistemaker, M.A. Posthumus and H.L.C. Meuzelaar: Simultaneous opto-electrical ion selection of submicrosecond laser induced desorption processes In: Proceedings International Symposium Dynamic Mass Spectrometry, University of Salford, England, 5-7 July, 1997 /ed. D. Price and J.F.J. Todd, Heyden, 1978. - pp. 114-120