| Reference |
D. Hoonhout, C.B.W. Kerkdijk, R.S. Bhattacharya, H.H. Kersten, W.C. Turkenburg and F.W. Saris: Surface layer analysis by MEIS using a solid state detector In: Proceedings of the Third International Conference on Ion Beam Analysis : Washington, D.C., June 27-July 1, 1977 /ed. E.A. Wolicki, J.W. Butler and P.A. Treado, North-Holland, 1978. - pp. 355-360 |
