R.J. Smith, A.W. Denier van der Gon and J.F. van der Veen, Medium energy ion scattering studies of thin Pd films on Al(111) and Al(110) surfaces, Surf. Sci. 233, 103-114 (1990)
M.P. van Albada, J.F. de Boer and A. Lagendijk, Observation of Long-Range intensity correlation in the transport of coherent light through a random medium, Phys. Rev. Lett. 64, 2787-2790 (1990)
R. Schreutelkamp, J.R. Liefting, P.M. Zagwijn, W.X. Lu and F.W. Saris, Addendum to "Range straggling of MeV ions in amorphous silicon; discrepancies with TRIM", Nucl. Instrum. Methods Phys. Res., Sect B 47, 329-331 (1990)
W.F.J. Slijkerman, A.E.M.J. Fischer, J.F. van der Veen, I. Ohdomari, S. Yoshida and S. Misawa, Formation of the Ni-SiC(001) interface studied by high-resolution ion backscattering, J. Appl. Phys. 66, 666-673 (1989)
R. van Silfhout, J.W.M. Frenken, J.F. van der Veen, S. Ferrer, A.D. Johnson, H.S. Derbyshire, C. Norris and J.E. MacDonald, X-ray intensity oscillations occuring during growth of Ge on Ge(111) - a comparison with RHEED, J. Phys.: Condens. Matter 1, 213-214 (1989)
R.-G.C. Wojke, W.H. Urbanus, R.J.J.M. Steenvoorden, J.G. Bannenberg, H. Klein, A. Schempp, R.W. Thomae, T. Weis and P.W. van Amersfoort, Tailoring of the rf properties of a multichannel accelerator for MeV energies, Nucl. Instrum. Methods Phys. Res. A 278, 318-328 (1989)
