Range straggling of MeV ions in amorphous silicon: discrepancies with trim Back to all publications Publication date 1 January 1990 Reference R. Schreutelkamp, J.R. Liefting, P.M. Zagwijn, W.X. Lu and F.W. Saris, Range straggling of MeV ions in amorphous silicon: discrepancies with trim, Nucl. Instrum. Methods Phys. Res., Sect B 48, 448-452 (1990) Request this article
