Defect states of amorphous Si probed by the diffusion and solubility of Cu Back to all publications Publication date 1 January 1990 Reference A. Polman, D.C. Jacobson, S. Coffa, J.M. Poate, S. Roorda and W.C. Sinke, Defect states of amorphous Si probed by the diffusion and solubility of Cu, Appl. Phys. Lett. 57, 1230-1232 (1990) Group Photonic Materials Download (pre)print
