Publications - Proceedings

G.N. van den Hoven, E. Snoeks, A. Polman, C. van Dam, J.W.M. van Uffelen and M.K. Smit: Optical gain in erbium-implanted Al2O3 waveguides In: ECIO '95 Proceedings 7th European Conference on Integrated Optics, April 3-6, 1995 Delft, The Netherlands : Regular and Invited Papers /ed. L. Shi, L.H. Spiekman and X.J.M. Leijtens, Delft University Press, 1995. - pp. 229-232

I. Pastorova, C.G. de Koster and J.J. Boon: HPLC-FAB-MS and GCMS study of aromatic compounds of "gum benzoin" resins In: Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia, May 21-26, 1995 /ed. M.M. Ross, ASMS, 1995.

R.M.A. Heeren, G.J. van Rooij, M.C. Duursma, C.G. de Koster and J.J. Boon: Characterisation of electrosprayed polymers with MALDI-FT-ICR-MS In: Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlants, Georgia, May 21-26, 1995 /ed. M.M. Ross, ASMS, 1995.

M.H.J. Hagen, C.P. Lowe and D. Frenkel: Long time tails in stress correlation functions In: 25 Years of Non-Equilibrium Statistical Mechanics : Proceedings of the XIII Sitges Conference, held in Sitges, Barcelona, Spain, 13-17 June 1994 /ed. J.J. Brey, J. Marro, J.M. Rub and M. San Miguel, Cham: Springer, 1995. - pp. 240-249

C.M. Yang, K.V. Shcheglov, M.L. Brongersma, A. Polman and H.A. Atwater: Correlation of size and photoluminescence for Ge nanocrystals in SiO2 matrices In: Microcrystalline and Nanocrystalline Semiconductors /ed. R.W. Collins, C.C. Tsai, M. Hirose, F. Koch and L. Brus, Materials Research Society, 1995. - pp. 181-186

M.J. Keevers, F.W. Saris, G.C. Zhang, J. Zhao, M.A. Green and R.G. Elliman: Screening of optical dopants in silicon solar cells for improved infrared response In: 13th European Photovoltaic Solar Energy Conference : Proceedings of the International Conference, held at Nice, France 23-27 October, 1995 /ed. W. Freiesleben, W. Palz, H.A. Ossenbrink and P. Helm, Bedford, 1995. - pp. 1215-1218

C. van Dam, J.W.M. van Uffelen, M.K. Smit, G.N. van den Hoven and A. Polman: Optical imaging of multimode interference patterns with a resolution below the diffraction limit In: ECIO '95 Proceedings 7th European Conference on Integrated Optics, April 3-6, 1995 Delft, The Netherlands : Regular and Invited Papers /ed. L. Shi, L.H. Spiekman and X.J.M. Leijtens, Delft University Press, 1995. - pp. 125-128

G.A. van der Doelen and J.J. Boon: Mass spectrometry of resinous compounds from paintings: characterisation of dammar and naturally aged dammar varnish by DTMS and HPLC/GC-MS In: Resins, Ancient and Modern : Pre-prints of the SSCR's 2nd Resins Conference held at the Department of Zoology, University of Aberdeen 13-14 September 1995 /ed. M.M. Wright and J.H. Townsend, Scottish Society for Conservation & Preservation, 1995. - pp. 70-75

J.J. Boon, K.-J. van den Berg, J.B.M. Pureveen, G.A. van der Doelen, K.M. Groen, J. van Och and A. van Grevenstein: Direct temperature resolved mass spectrometry (DTMS) as a tool to study painted art: a case study of "De Eendenfamilie" by W. Maris, a 19th century Dutch impressionist painter In: Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia, May 21-26, 1995 /ed. M.M. Ross, ASMS, 1995.

R. Schlatmann, J.D. Shindler and J. Verhoeven: Diffuse x-ray scattering measurements from multilayers In: Physics of X-ray Multilayer Structures : Summaries of Papers Presented at the Physics of X-ray Multilayer Structures Topical Meeting, March 14-17, 1994, Jackson Hole, Wyoming : Conference Edition, Optical Society of America, 1994. - pp. 122-124