• C. van Dam, J.W.M. van Uffelen, M.K. Smit, G.N. van den Hoven and A. Polman: Optical imaging of multimode interference patterns with a resolution below the diffraction limit In: ECIO '95 Proceedings 7th European Conference on Integrated Optics, April 3-6, 1995 Delft, The Netherlands : Regular and Invited Papers /ed. L. Shi, L.H. Spiekman and X.J.M. Leijtens, Delft University Press, 1995. - pp. 125-128

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  • G.A. van der Doelen and J.J. Boon: Mass spectrometry of resinous compounds from paintings: characterisation of dammar and naturally aged dammar varnish by DTMS and HPLC/GC-MS In: Resins, Ancient and Modern : Pre-prints of the SSCR's 2nd Resins Conference held at the Department of Zoology, University of Aberdeen 13-14 September 1995 /ed. M.M. Wright and J.H. Townsend, Scottish Society for Conservation & Preservation, 1995. - pp. 70-75

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  • J.J. Boon, K.-J. van den Berg, J.B.M. Pureveen, G.A. van der Doelen, K.M. Groen, J. van Och and A. van Grevenstein: Direct temperature resolved mass spectrometry (DTMS) as a tool to study painted art: a case study of "De Eendenfamilie" by W. Maris, a 19th century Dutch impressionist painter In: Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia, May 21-26, 1995 /ed. M.M. Ross, ASMS, 1995.

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  • C.G. de Koster, M.C. Duursma, P.W.F. Arisz, R.M.A. Heeren and J.J. Boon: Analysis of the substituent distribution in O-methyl celluloses by MALDI-FT-ICR-MS In: Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia, May 21-26, 1995 /ed. M.M. Ross, ASMS, 1995.

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  • H.G. Muller: Photoionization with super-intense lasers In: Physics with Multiply Charged Ions : Proceedings of a NATO Advanced Study Institute on Physics with Multiply Charged Ions, held July 18-30, 1994, in Cargèse, France /ed. D. Liesen, Plenum, 1995. - pp. 239-261

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  • E.R. Wouters, L.D.A. Siebbeles, B. Buijsse and W.J. van der Zande: The effect of electron spin on the anisotropy of H2 photofragments In: Laser Techniques for State-Selected and State-to-State Chemistry III /ed. J.W. Hepburn, Bellingham: SPIE, 1995. - pp. 60-73

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  • M. Lohmeier, W.J. Huisman, G. ter Horst, P.M. Zagwijn, A. Nishiyama, C.L. Nicklin, T.S. Turner and E. Vlieg: Atomic structure of ultrathin erbium silicides on Si(111) In: Evolution of ThinFilm and Surface Structure and Morphology /ed. B.G. Demczyk, E. Garfunkel, B.M. Clemens, E.D. Williams and J.J. Cuomo, Materials Research Society, 1995. - pp. 281-286

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  • G.N. van den Hoven, E. Snoeks, A. Polman, C. van Dam, J.W.M. van Uffelen and M.K. Smit: Optical gain in erbium-implanted Al2O3 waveguides In: ECIO '95 Proceedings 7th European Conference on Integrated Optics, April 3-6, 1995 Delft, The Netherlands : Regular and Invited Papers /ed. L. Shi, L.H. Spiekman and X.J.M. Leijtens, Delft University Press, 1995. - pp. 229-232

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  • I. Pastorova, C.G. de Koster and J.J. Boon: HPLC-FAB-MS and GCMS study of aromatic compounds of "gum benzoin" resins In: Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlanta, Georgia, May 21-26, 1995 /ed. M.M. Ross, ASMS, 1995.

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  • R.M.A. Heeren, G.J. van Rooij, M.C. Duursma, C.G. de Koster and J.J. Boon: Characterisation of electrosprayed polymers with MALDI-FT-ICR-MS In: Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics, Atlants, Georgia, May 21-26, 1995 /ed. M.M. Ross, ASMS, 1995.

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