• H.L.C. Meuzelaar and P.G. Kistemaker, A technique for fast and reproducible fingerprinting of bacteria by pyrolysis mass spectrometry, Anal. Chem. 45, 587-590 (1973)

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  • H. Tawara and F.J. de Heer, Carbon K-shell X-ray production by heavy-ion impact in gas targets, Physica 68, 607-614 (1973)

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  • A. van der Meulen, C.A. Visser and A.E. de Vries, Bestudering van reactieve processen in het eV gebied door middel van molecuulstralen, NTvN 39, 292-293 (1973)

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  • C.P. Bhalla, Effects of multiple ionization on K-shell fluorescence yield transition energies and intensity ratios for argon, Phys. Lett. A 45, 19-20 (1973)

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  • W.F. van der Weg, W.H. Kool and H.E. Roosendaal, Proton induced X-ray emission compared with proton backscattering for surface analysis, Surf. Sci. 35, 413-414 (1973)

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  • F.W. Byron, C.J. Joachain and M.J. van der Wiel, On the double ionization of helium-like atoms by high-energy electron impact, J. Phys. B: At., Mol. Opt. Phys. 6, 375-377 (1973)

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  • J. Kistemaker, Electrotechnische ontwikkelingen tussen 1865 en 1885, Sci. Hist. 1, 3-6 (1973)

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  • W.F. van der Weg, W.H. Kool, H.E. Roosendaal and F.W. Saris, Silicon surface studies by means of proton backscattering and proton induced x-ray emission, Radiat. Eff. 17, 245-252 (1973)

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  • C.A. van de Runstraat, T.R. Govers, W.B. Maier and R.F. Holland, Extension of the Meinel system of N2+ to high vibrational levels of the A 2Õu state, Chem. Phys. Lett. 18, 549-552 (1973)

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  • A.J.H. Boerboom and M.F. Laranjeira, The application of Liouville's theorem in mass spectrometry, Port. Phys. 8, 245-259 (1973)

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