W.F.J. Slijkerman, J.M. Gay, P.M. Zagwijn, J.F. van der Veen, J.E. MacDonald, A.A. Williams, D.J. Gravesteijn and G.F.A. van de Walle, X-ray reflectivity of an Sb delta-doping layer in silicon, J. Appl. Phys. 68, 5105-5108 (1990)
E.J. Puik, M.J. van der Wiel, J. Verhoeven and H. Zeijlemaker, Ion-beam-assisted deposition of Ni/C multilayer X-ray mirrors, Thin Solid Films 193, 782-787 (1990)
H. Fleurent, D. Schoemaker and W. Joosen, Tl+Tl0(1)-like dimer centers in KCl and RbCl doped with Tl+, In+ and Ga+: a resonant Raman study, Phys. Rev. B 41, 10138-10145 (1990)
M.G. Tenner, F.H. Geuzebroek, E.W. Kuipers, A.E. Wiskerke, A.W. Kleyn, S. Stolte and A. Namiki, Orientation dependence of rotational excitation in NO scattering from Ag(111), Chem. Phys. Lett. 168, 45-50 (1990)
