Publications - Resonant Nanophotonics

C.-C. Huang, Y. Tang, M. van der Laan, J. van de Groep, A.F. Koenderink and K. Dohnalová, Band-Gap Tunability in Partially Amorphous Silicon Nanoparticles Using Single-Dot Correlative Microscopy, ACS Appl. Nano Mater. 4, (1), 288-296 (2021)

R. Röhrich, Unconventional metrology: Merging nanophotonics with computational imaging, University of Amsterdam, UvA, 2020-12-11

N.J. Schilder, T.A.W. Wolterink, C. Mennes, R. Röhrich and A.F. Koenderink, Phase-retrieval Fourier microscopy of partially temporally coherent nanoantenna radiation patterns, Opt. Express 28, (25), 37844-37859 (2020)

A. Berkhout, Planar hybrid plasmonic-photonic resonators: an interferometric investigation, University of Amsterdam, UvA, 2020-11-13

R.D. Buijs, N.J. Schilder, T.A.W. Wolterink, G. Gerini, E. Verhagen and A.F. Koenderink, Super-Resolution without Imaging: Library-Based Approaches Using Near-to-Far-Field Transduction by a Nanophotonic Structure, ACS Photonics 7, (11), 3246-3256 (2020)

K.G. Cognée, H.M. Doeleman, P. Lalanne and A.F. Koenderink, Generation of pure OAM beams with a single state of polarization by antenna-decorated microdisk resonators, ACS Photonics 7, (11), 3049-3060 (2020)

E. Marino, A. Sciortino, A. Berkhout, K.E. MacArthur, M. Heggen, T. Gregorkiewicz, T.E. Kodger, A. Capretti, C.B. Murray, A.F. Koenderink, F. Messina and P. Schall, Simultaneous Photonic and Excitonic Coupling in Spherical Quantum Dot Supercrystals, ACS Nano 14, (10), 13806-13815 (2020)

A. Berkhout, T.A.W. Wolterink and A.F. Koenderink, Strong coupling to generate complex birefringence - metasurface in the middle etalons, ACS Photonics 7, (10), 2799-2806 (2020)

H.M. Doeleman, C.D. Dieleman, C. Mennes, B. Ehrler and A.F. Koenderink, Observation of Cooperative Purcell Enhancements in Antenna-Cavity Hybrids, ACS Nano 14, (9), 12027-12036 (2020)

R. Röhrich, G. Oliveri, S. Kovaios, T.V. Tenner, A.J. den Boef, J.T.B. Overvelde and A.F. Koenderink, Uncertainty estimation and design optimization of 2D diffraction-based overlay metrology targets, ACS Photonics 7, (10), 2765-2777 (2020)