C. Messinis, T.T.M. van Schaijk, N. Pandey, A. Koolen, I. Shlesinger, X. Liu, S. Witte, J.F. de Boer and A. den Boef, Aberration calibration and correction with nano-scatterers in digital holographic microscopy for semiconductor metrology, Opt. Express 29, (23), 38237-38256 (2021)
E. Oksenberg, I. Shlesinger, A. Xomalis, A. Baldi, J.J. Baumberg, A.F. Koenderink and E.C. Garnett, Energy-resolved plasmonic chemistry in individual nanoreactors, Nat. Nanotechnol. 16, 1378-1385 (2021)
T.A.W. Wolterink, R.D. Buijs, G. Gerini, E. Verhagen and A.F. Koenderink, Calibration-based overlay sensing with minimal-footprint targets, Appl. Phys. Lett. 119, (11), 111104: 1-6 (2021)
R. Kolkowski, S. Kovaios and A.F. Koenderink, Pseudochirality at exceptional rings of optical metasurfaces, Phys. Rev. Research 3, (2), 023185: 1-16 (2021)
I.M. Palstra, I.M. de Buy Wenniger, B.K. Patra, E.C. Garnett and A.F. Koenderink, Intermittency of CsPbBr3 Perovskite Quantum Dots Analyzed by an Unbiased Statistical Analysis, J. Phys. Chem. C 125, (22), 12061-12072 (2021)
I.M. Palstra and A.F. Koenderink, A Python Toolbox for Unbiased Statistical Analysis of Fluorescence Intermittency of Multilevel Emitters, J. Phys. Chem. C 125, (22), 12050-12060 (2021)
R. Röhrich, A.F. Koenderink, S. Witte and L. Lötgering, Spatial coherence control and analysis via micromirror-based mixed-state ptychography, New J. Phys. 23, 053016: 1-15 (2021)
