TEM FEI TecnaiG2 20 X-Twin
The Technai G2 20 X-Twin is a high resolution Transmission Electron Microscope (TEM).
Specifications
- FEI TecnaiG2 20 X-TWIN
- Flexible high tension 20- 200kV
- Electron Gun (SFEG)
- TEM point resolution 0.3nm
- STEM resolution 1 nm
- Scan Imaging Technique
- SED configuration
- HAADF detector for 200kV
- Gatan Ultrascan 1000 P for 200kV
- Slow-Scan CCD Imaging Technique
- TEM Scribting
- Magnification Calibration Package
- Compu Stage double tilt holder ±70° with Softloc
- TEM HR-TEM STEEM, HR-STEM and Diffraction imaging
