Publications - Proceedings

R.M.A. Heeren, G.J. van Rooij, N. Wyplosz and J.J. Boon: Polymer analysis with an external ion source MALDI qudrupole ion trap mass spectrometer In: Proceedings ASMS : The 45th ASMS Conference on Mass Spectrometry and Allied Topics, June 1-5, 1997, Palm Springs, California, [s.n.], 1997.

J.A. Heimberg, T. Zijlstra, E. van der Drift, D. Glastra van Loon, E. de Kuyper, H.J. Hug and J.W.M. Frenken: New scanning probes for nanotribology In: Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical Measurements in the Micro- and Nanometre Range with Far and Near Field Methods, on 6th and 7th November 1997 in Wien, Austria. (PTB-Bericht; 30) /ed. K. Hasche, E. Mirand and G. Wilkening, Physikalisch Technische Bundesanstalt, 1997. - pp. 25-31

G.J. van Rooij, R.M.A. Heeren, N. Wyplosz and J.J. Boon: Spatially resolved surface analysis in an ion trap mass spectrometer with an external ion source In: Proceedings ASMS : The 45th ASMS Conference on Mass Spectrometry and Allied Topics, June 1-5, 1997, Palm Springs, California, [s.n.], 1997.

R.C. Constantinescu, H.G. Muller, J.M. Schins, P. Breger, Pierre Agostini, H.-J. Voorma, E. Louis, F. Bijkerk, A. Bouhal, G. Grillon, A. Antonetti and A. Mysyrowicz: A collinear setup for optical/x-ray cross correlation measurements based on laser-assisted Auger decay In: Super-Intense Laser-Atom Physics IV : Proceedings of the NATO Advanced Research Workshop on Super-Intense Laser-Atom Physics (SILAP IV), Moscow, Russia, August 5-9, 1995 /ed. H.G. Muller and M.V. Fedorov, Kluwer, 1996. - pp. 371-380

F. Priolo, S. Coffa, G. Franzò and A. Polman: Excitation mechanisms and light emitting device performances in Er-doped crystalline Si In: Rare Earth Doped Semiconductors II : Symposium held April 8-10, 1996, San Francisco, California, U.S.A. /ed. S. Coffa, A. Polman and R.N. Schwartz, Materials Research Society, 1996. - pp. 305-316

M.S. Hoogeman, D.C. Schlößer, J.-B. Sanders, L.K. Kuipers, M.F. Chang, M.A.J. Klik, D. Glastra van Loon, R.W.M. Loos, J.J. van der Linden and J.W.M. Frenken: Surface energetics and dynamics measured from STM movies In: Thin Films and Phase Transitions on Surfaces : Proceedings of the Second EWSSW' 96, February 18-24, Pamporovo, Bulgaria /ed. M. Michailov, Institute of Physical Chemistry, Bulgarian Academy of Sciences, 1996. - pp. 95-108

W.J. van der Zande, V. Zengin, C. Strömholm, G. Sundström and M. Larsson: Product-state information from dissociative recombination of H2+ In: Proceedings of the 1995 Workshop on Dissociative Recombination : Theory, Experiment and Applications III /ed. D. Zajfman, J.B.A. Mitchell, D. Schwalm and B.R. Rowe, World Scientific, 1996. - pp. 135-138

D. Frenkel and G.C.A.M. Mooij: Configurational-bias Monte Carlo In: Monte Carlo and Molecular Dynamics of Condensed Matter Systems : Euroconference on Computer Simulation in Condensed Matter Physics and Chemistry, Como, 3-28 July 1995 /ed. K. Binder and G. Ciccotti, Italian Physical Society, 1996. - pp. 164-177

J.H. Hoogenraad and L.D. Noordam: The sign of matrix elements in free-electron-laser multiphoton ionization In: Coherence and Quantum Optics VII : Proceedings of the Seventh Rochester Conference on Coherence and Quantum Optics, held at the University of Rochester, June 7-10, 1995 /ed. J.H. Eberly, L. Mandel and E. Wolf, Plenum, 1996. - pp. 503-504

G.N. van den Hoven, R.J.I.M. Koper, A. Polman, C. van Dam, J.W.M. van Uffelen and M.K. Smit: Net optical gain at 1.53 µm in an Er-doped Al2O3 waveguide amplifier on silicon In: Summaries of the Papers presented at the Topical Meeting Optical Amplifiers and their Applications, July 11-13, 1996 Monterey, California : Technical Digest, Optical Society of America, 1996. - pp. 44-47