• C. de Vreugd, R.W. Wijnaendts van Resandt and J.H. Los, Electron-detachment in differential I- + Ne cross section measurements, Chem. Phys. Lett. 64, 175-177 (1979)

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  • T.M. El-Sherbini, A. Salop, E.W.P. Bloemen and F.J. de Heer, Target dependence of excitation resulting from electron capture in collisions of 200 keV Ar6+ ions with noble gases, J. Phys. B: At., Mol. Opt. Phys. 12, 579-582 (1979)

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  • B. van Wingerden, P.E. van der Leeuw, F.J. de Heer and M.J. van der Wiel, Partial oscillator strengths (25-40eV) for repulsive states of D2(H2)., J. Phys. B: At., Mol. Opt. Phys. 12, 1559-1576 (1979)

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  • A.P. Hitchcock, C.E. Brion and M.J. van der Wiel, Ionic fragmentation of inner shell excited states of CO2 and N20, Chem. Phys. Lett. 66, 213-217 (1979)

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  • L.W. Wiggers, H.G. Koekkoek, A.H. Buth and F.W. Saris, Damage production at the surface of Si single crystals by 200 keV He+ bombardment, Radiat. Eff. 42, 77-81 (1979)

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  • J. Kistemaker, Society, economics and R and D, Phys. Bull. 30, (1979)

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  • B. van Wingerden, J.T.N. Kimman, M. van Tilburg, E. Weigold, C.J. Joachain, B. Piraux and F.J. de Heer, Absolute triple- and double-differential cross sections for ionisation of helium by electron impact, J. Phys. B: At., Mol. Opt. Phys. 12, 627-631 (1979)

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  • J.A. van Vechten, R. Tsu, F.W. Saris and D. Hoonhout, Reasons to believe pulsed laser annealing if Si does not involve simple thermal melting, Phys. Lett. A 74, 417-421 (1979)

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  • C. de Vreugd, R.W. Wijnaendts van Resandt and J.H. Los, The well depths of XeF- and XeCI- from differential scattering measurements, Chem. Phys. Lett. 65, 93-94 (1979)

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  • J.R. Haverkamp, H.L.C. Meuzelaar, E.C. Beuvery, P.M. Boonekamp and R.H. Tiesjema, Characterization of Neisseria Meningitides Capsular Polysaccharides Containing Sailic Acid by Pyrolysis Mass Spectrometry, Anal. Biochem. 104, 407-418 (1979)

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