J.T.N. Kimman, P. Kruit and M.J. van der Wiel, Highly resolved electron spectra for resonantly enhanced four-photon ionization of NO, Chem. Phys. Lett. 88, 576-580 (1982)
R. Weber, K. Levsen, G.J. Louter, A.J.H. Boerboom and J.R. Haverkamp, Direct mixture analysis of surfactants by combined field desorption/collisionally activated dissociation mass spectrometry with simultaneous ion detection, Anal. Chem. 54, 1458-1466 (1982)
R.M. Tromp, E.J. van Loenen, M. Iwami, R.G. Smeenk and F.W. Saris, Ion beam crystallography of metal-silicon interfaces: Pd-Si(111), Thin Solid Films 93, 151-159 (1982)
W. Windig, P.G. Kistemaker and J.R. Haverkamp, Chemical Interpretation of Differences in Pyrolysis Mass Spectra of Simulated Mixtures of Biopolymers by Factor analysis with Graphical Rotation, J. Anal. Appl. Pyrolysis 3, 199-212 (1981)
