J. Verhoeven, A. Keppel, R. Schlatmann, Y. Xue and I.V. Katardjiev, X-ray reflection, a technique for measuring sputtering yields of thin films, Nucl. Instrum. Methods Phys. Res., Sect B 94, 395-403 (1994)
R. Serna, E. Snoeks, G.N. van den Hoven and A. Polman, 1.5 µm room-temperature luminescence from Er-implanted oxygen-doped silicon epitaxial films grown by molecular beam epitaxy, J. Appl. Phys. 75, 2644-2647 (1994)
R.J.J.M. Steenvoorden, E.R.E. van der Hage, J.J. Boon, P.G. Kistemaker and T.L. Weeding, Investigation of the effects of cooling after laser desorption before post-ionization, Org. Mass Spectrom. 29, 78-84 (1994)
O. Ellegaard, J. Schou, B. Stenum, R. Pedrys, B. Warczak, D.J. Oostra, R.A. Haring and A.E. de Vries, Sputtering of solid nitrogen and oxygen by keV hydrogen ions, Surf. Sci. 302, 371-384 (1994)
R.M.A. Heeren, M.J. de Graaf, D. Ciric, H.J. Hopman and A.W. Kleyn, Angular and energy distributions of surface produced H- and D- ions in a barium surface conversion source, J. Appl. Phys. 75, 4340-4351 (1994)
A.B. van der Kamp, L.D.A. Siebbeles, W.J. van der Zande and P.C. Cosby, Evidence for predissociation of N2 a 1Πg(v≥7) by direct coupling to the A' 5Σ+g state, J. Chem. Phys. 101, 9271-9279 (1994)
