N.F. van Hulst, H. Gersen and L.K. Kuipers, Probing the negative permittivity perfect lens at optical frequencies using near-field optics and single molecule detection, Opt. Express 13, (5), 1604-1614 (2005)
A.J. Kleinnijenhuis, A.J.R. Heck, M.C. Duursma and R.M.A. Heeren, Does double electron capture lead to the formation of biradicals? An ECD-SORI-CID study on lacticin 481, J. Am. Soc. Mass Spectrom. 16, 1595-1601 (2005)
M.J.H. Kessels, J. Verhoeven, F.D. Tichelaar and F. Bijkerk, Ion-induced interface layer formation in W/Si and WRe/Si multilayers, Surf. Sci. 582, 227-234 (2005)
J.J. Boon, E.S.B. Ferreira and K. Keune, Imaging analytical studies of Old Master paints using FTIR, SIMS and SEMEDX of embedded paint cross sections, Microsc. Microanal. 11, 1370-1371 (2005)
P. Noble and A. van Loon, New insights into Rembrandts Susanna : changes of format - smalt discoloration - identification of vivianite - fading of yellow and red lakes - lead white paint, ArtMatters 2, 76-97 (2005)
S. Zamith, Z. Ansari, F. Lépine and M.J.J. Vrakking, Single-shot measurement of revival structures in femtosecond laser-induced alignment of molecules, Opt. Lett. 30, 2326-2328 (2005)
I.M. Taban Barbu, L.A. McDonnell, A. Roempp, J. Cerjak and R.M.A. Heeren, SIMION analysis of a high performance linear accumulation octopole with enhanced ejection capabilities, Int. J. Mass Spectrom. 244, 135-143 (2005)