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K. Keune, A. van Loon and J.J. Boon, SEM backscattered-electron images of paint cross-sections as information source for the presence of the lead white pigment and lead-related degradation and migration phenomena in oil paintings, Microsc. Microanal. 17, (5), 696-701 (2011)
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M. Frimmer, Y. Chen and A.F. Koenderink, Scanning emitter lifetime imaging microscopy for spontaneous emission control, Phys. Rev. Lett. 107, (Article number: 123602), 1-5 (2011)
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F. van Beijnum, C. Rétif, C.B. Smiet and M.P. van Exter, Transmission processes in random patterns of subwavelength holes, Opt. Lett. 36, (18), 3666-3668 (2011)
J.C. Prangsma, D. van Oosten and L.K. Kuipers, Local investigation of the optical properties of subwavelength rectangular holes with a focused beam of electrons, Phil. Trans. R. Soc. A 369, (1050), 3456-3471 (2011)
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