• M.L. Brongersma, K.S. Min, E. Boer, T. Tambo, A. Polman and H.A. Atwater: Tailoring the optical properties of Si nanocrystals in SiO2: Materials issues and nanocrystal laser perspectives In: Materials and Devices for Silicon-Based Optoelectronics : Symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A. /ed. A. Polman, S. Coffa and R. Soref, Pittsburgh: MRS, 1998. - pp. 213-218

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  • P.R. ten Wolde and D. Frenkel, Numerical study of gas-liquid nucleation in partially miscible binary mixtures, J. Chem. Phys. 109, 9919-9927 (1998)

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  • W.R. Koppers, K. Tsumori, J.H.M. Beijersbergen, T.L. Weeding, P.G. Kistemaker and A.W. Kleyn, Dissociative scattering of polyatomic ions from metal surfaces: CF +3 on Ag(111) and (Ba/Ag(111), Int. J. Mass Spectrom. Ion Processes 174, 11-34 (1998)

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  • K.-J. van den Berg, J. van der Horst, J.J. Boon and O.O. Sudmeijer, Cis-1,4-poly-ß-myrcene; the structure of the polymeric fraction of Mastic Resin (Pistacia lentiscus L.) elucidated, Tetrahedron Lett. 39, 2645-2648 (1998)

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  • H.G. Jenniskens, L. Philippe, W. van Essenberg, M.F. Kadodwala and A.W. Kleyn, Tert-butyl nitrite surface photochemistry: The transition from submonolayer to multilayer behavior, J. Chem. Phys. 108, 1688-1701 (1998)

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  • J.P.K. Doye, R.P. Sear and D. Frenkel, The effect of chain stiffness on the phase behaviour of isolated homopolymers, J. Chem. Phys. 108, 2134-2142 (1998)

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  • V.A. Klap, J.J. Boon, M.A. Hemminga and J. van Soelen, Chemical characterization of lignin preparations of fresh and decomposing Spartina anglica by pyrolysis mass spectrometry, Org. Geochem. 28, 707-727 (1998)

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  • P.I.C. Teixeira, A.J. Masters and B.M. Mulder, Biaxial nematic order in the hard-boomerang fluid, Mol. Cryst. Liq. Cryst. 323, 167-189 (1998)

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  • J. de Maaijer-Gielbert, A. Somogyi, V.H. Wysocki, P.G. Kistemaker and T.L. Weeding, Surface-induced dissociation of diphenyl ether, Int. J. Mass Spectrom. Ion Processes 174, 81-94 (1998)

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  • E. Vlieg, A (2+3)-type surface diffractometer: Mergence of the z-axis and (2+2)-type geometries, J. Appl. Crystallogr. 31, 198-203 (1998)

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