R. Barczyk, N. Parappurath, S. Arora, T.A. Bauer, F. Alpeggiani, L.K. Kuipers and E. Verhagen: Topological photonic crystal nanocavities for confinement of light at telecom wavelengthsIn: Proc. SPIE 11796, Active Photonic Platforms XIII, 117961G, SPIE-The International Society for Optics and Photonics, 2021.
J.J. Slim, J. del Pino, J.P. Mathew and E. Verhagen: Synthetic Magnetic Fields and Non-Hermitian Dynamics for Phonons in a Nano-Optomechanical SystemIn: Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2021, New York: IEEE, 2021.
S. Arora, T.A. Bauer, R. Barczyk, E. Verhagen and L.K. Kuipers: Direct quantification of topological protection in symmetry-protected photonic edge states at telecom wavelengthsIn: Conference on Lasers and Electro-Optics, CLEO 2021, OSA Technical Digest, 2021.
J. Aizpurua, H.A. Atwater, J.J. Baumberg, S.I. Bozhevolnyi, M.L. Brongersma, J.A. Dionne, H. Giessen, N. Halas, Y.S. Kivshar, M.F. Kling, F. Krausz, S. Maier, S.V. Makarov, M. Mikkelsen, M. Moskovits, P. Norlander, T. Odom, A. Polman, C.W. Qiu, M. Segev, V.M. Shalaev, P. Törmä, D.P. Tsai, E. Verhagen, A. Zayats, X. Zhang and N.I. Zheludev, Mark Stockman: Evangelist for Plasmonics, ACS Photonics 8, (3), 683-698 (2021)
E. Verhagen, N. Parappurath, S. Arora, R. Barczyk, F. Alpeggiani and L.K. Kuipers: Topological Protection of Light Propagation in Photonic CrystalsIn: 2020 European Conference on Optical Communications (ECOC), New York: IEEE, 2021. - pp. 1-4
A. Laucht, F. Hohls, N. Ubbelohde, F.M. Gonzalez-Zalba, D.J. Reilly, S. Stobbe, T. Schröder, P. Scarlino, J.V. Koski, A. Dzurak, C.-H. Yang, J. Yoneda, F. Kuemmeth, H. Bluhm, J. Pla, C. Hill, J. Salfi, A. Oiwa, J.T. Muhonen, E. Verhagen, M.D. LaHaye, H.H. Kim, A.W. Tsen, D. Culcer, A. Geresdi, J.A. Mol, V. Mohan, P.K. Jain and J. Baugh, Roadmap on quantum nanotechnologies, Nanotechnology 32, (16), 162003: 1-49 (2021)
P. Neveu, J. Clarke, M.R. Vanner and E. Verhagen, Preparation and verification of two-mode mechanical entanglement through pulsed optomechanical measurements, New J. Phys. 23, (2), 023026: 1-11 (2021)