Reference |
E. Vlieg, J.F. van der Veen, R. van Silfhout and I.K. Robinson: X-ray diffraction from static and growing surfaces In: Advanced Materials III : Proceedings of the Special Symposium on Advanced Materials ""High Tech Materials - 1991 - Autumn, Held in Nagoya, Japan, November 5-8, 1991 /ed. T. Imura and H. Fujita, The Joint Committee for Advanced Materials Research, 1992. - pp. 94-99 |