Publications - Proceedings

R.M.A. Heeren, J.J. Boon, P. Noble and J. Wadum: Integrating imaging FTIR and secondary ion mass spectrometry for the analysis of embedded paint cross-sections In: 12th Triennial Meeting Lyon 29 August - 3 September 1999 ; Vol. 1, ICOM-CC ICOM Committee for Conservation, James, 1999. - pp. 228-233

J.J. Boon and G.A. van der Doelen: Advances in the current understanding of aged dammar and mastic triterpenoid varnishes on the molecular level In: Firnis : Material - Ästhetik - Geschichte, Internationales Kolloquium, Braunschweig, 15.-17. Juni 1998 = Varnish : Material - Aesthetics - History, International Colloquium, Braunschweig, 15-17 June 1998 /ed. A. Harmssen, Herzog-Anton-Ulrich-Museum, 1999. - pp. 92-103

J. de Maaijer-Gielbert, R.M.A. Heeren, P.G. Kistemaker and T.L. Weeding: Gas-phase collisional activation of polypropylenamine dendrimers in ESI-FTMS and MALDI-ITMS In: Proceedings of the 46th ASMS Conference on Mass Spectrometry and Allied Topics, May 31 - June 4, 1998, Orlando, Florida, [s.n.], 1998.

S. Peulvé, J.J. Boon, M.C. Duursma, O.F. van den Brink, P.B. O'Connor and R.M.A. Heeren: Mass spectrometric studies of proteins in fresh egg and aged egg tempera paint films In: Advances in Mass Spectrometry ; Vol. 14 : Proceedings of the 14th International Mass Spectrometry Conference held in Tampere 25-29 August 1997 /ed. E.J. Karjalainen, A.E. Hesso, J.E. Jalonen and U.P. Karjalainen, Elsevier B.V., 1998. - pp. 1-15

L.D. Noordam and F. Robicheaux: Dynamics of autoionizing Rydberg atoms in an electric field In: Atomic Physics 16 : Sixteenth International Conference on Atomic Physics, Windsor, Ontario, Canada August 1998 /ed. W.E. Baylis and G.W. Drake, American Institute of Physics, 1998. - pp. 197-208

J.D.J. van den Berg, K.-J. van den Berg and J.J. Boon: GC/MS analysis of fractions of cured and aged drying oil paints In: Advances in Mass Spectrometry ; vol. 14 : Proceedings of the 14th International Mass Spectrometry Conference held in Tampere 25-29 August 1997 /ed. E.J. Karjalainen, A.E. Hesso, J.E. Jalonen and U.P. Karjalainen, Elsevier B.V., 1998. - pp. 1-8

M.L. Brongersma, K.S. Min, E. Boer, T. Tambo, A. Polman and H.A. Atwater: Tailoring the optical properties of Si nanocrystals in SiO2: Materials issues and nanocrystal laser perspectives In: Materials and Devices for Silicon-Based Optoelectronics : Symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A. /ed. A. Polman, S. Coffa and R. Soref, Pittsburgh: MRS, 1998. - pp. 213-218

R.M.A. Heeren, S. Koster, M.C. Duursma, G.J. van Rooij and J.J. Boon: Structural analysis of synthetic polymers with Electrospray FTICR-MS In: Proceedings of the 46th ASMS Conference on Mass Spectrometry and Allied Topics, May 31 - June 4, 1998, Orlando, Florida, [s.n.], 1998.

M.A. Gleeson, W.R. Koppers, K. Tsumori and A.W. Kleyn: Negative ion yields in hydrogen scattering from graphite surfaces In: Production and Neutralization of Negative Ions and Beams: Eight International Symposium / Production and Application of Light Negative Ions: Seventh European Workshop : A joint meeting /ed. C. Jacquot, The American Institute of Physics, 1998. - pp. 37-40

J.H. Townsend, L. Carlyle, A. Burnstock, M. Odlyha and J.J. Boon: Nineteenth-century paint media: The formulation and properties of megilps In: Painting Techniques, History, Materials and Studio Practice : Contributions to the Dublin Congress 7-11 September 1998 /ed. A. Roy and P. Smith, International Institute for Conservation of Historic and Artistic Works, 1998. - pp. 205-210