J.F.M. Westendorp, P.K. Rol, S. Doorn, H.H. Kersten, J. ter Beek, J. Derks, F.W. Saris, R. Koudijs and W.J. van Kilsdonk, A UHV system for simultaneous evaporation and ion beam mixing and in situ RBS analysis, Nucl. Instrum. Methods Phys. Res., Sect B 17, 66-72 (1986)
P.J. van den Hoek, A.D. Tenner, A.W. Kleyn and E.J. Baerends, Hyperthermal alkali-ion scattering from a metal surface: a theoretical study of the potential, Phys. Rev. B 34, 5030-5042 (1986)
F. Huussen, J.W.M. Frenken and J.F. van der Veen, A continuous-flow helium cryostat and sample holder with unrestricted manipulation for ionscattering experiments in uhv, Vacuum 36, 259-262 (1986)
J.F. van der Veen and E.J. van Loenen, High-resolution Rutherford backscattering spectrometry or metal-silicon interfaces, Surf. Sci. 168, 701-712 (1986)
A.E.M.J. Fischer, P.M.J. Marée and J.F. van der Veen, Characterization of ultrathin nickel layers on Si(111) using RHEED and RBS, Appl. Surf. Sci. 27, 143-150 (1986)
H.G. Muller, H.B. van Linden van den Heuvell and M.J. van der Wiel, Dressing of continuum states after MPI of Xe in a two-colour experiment, J. Phys. B: At., Mol. Opt. Phys. 19, 733-739 (1986)
C.E.D. Ouwerkerk, A.J.H. Boerboom, T. Matsuo and T. Sakurai, Simultaneous ion detection in a double focusing mass spectrometer with specially shaped magnetic pole faces, Int. J. Mass Spectrom. Ion Processes 70, 79-96 (1986)
