The well depths of XeF- and XeCI- from differential scattering measurements Back to all publications Publication date 1 January 1979 Reference C. de Vreugd, R.W. Wijnaendts van Resandt and J.H. Los, The well depths of XeF- and XeCI- from differential scattering measurements, Chem. Phys. Lett. 65, 93-94 (1979)
