The role of small-impact-parameter electron-loss processes on ion temperatures measured by active-beam plasma diagnostics Back to all publications Publication date 1 January 1989 Reference A.J.H. Donn, F.J. de Heer and R.E. Olson, The role of small-impact-parameter electron-loss processes on ion temperatures measured by active-beam plasma diagnostics, J. Appl. Phys. 65, 57-63 (1989) Request this article
