The role of layer growth on interface roughness in Ni-C multilayer X-ray mirrors Back to all publications Publication date 1 January 1988 Reference E.J. Puik, M.J. van der Wiel, H. Zeijlemaker and J. Verhoeven, The role of layer growth on interface roughness in Ni-C multilayer X-ray mirrors, Vacuum 38, 707-709 (1988) Request this article
