Summary Abstract: Extended x-ray absorption fine-structure features in the reflectivity of x-ray multilayers Back to all publications Publication date 1 January 1987 Reference H. van Brug, M.J. van der Wiel, M.P. Bruijn and J. Verhoeven, Summary Abstract: Extended x-ray absorption fine-structure features in the reflectivity of x-ray multilayers, J. Vac. Sci. Technol. A 5, 2028-2029 (1987) Request this article