Summary Abstract: Extended x-ray absorption fine-structure features in the reflectivity of x-ray multilayers

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Reference H. van Brug, M.J. van der Wiel, M.P. Bruijn and J. Verhoeven, Summary Abstract: Extended x-ray absorption fine-structure features in the reflectivity of x-ray multilayers, J. Vac. Sci. Technol. A 5, 2028-2029 (1987)