Structural relaxation and defect annihilation in pure amorphous silicon Back to all publications Publication date 1 January 1991 Reference S. Roorda, W.C. Sinke, J.M. Poate, D.C. Jacobson, S. Dierker, B.S. Dennis, D.J. Eaglesham, F. Spaepen and P. Fuoss, Structural relaxation and defect annihilation in pure amorphous silicon, Phys. Rev. B 44, 3702-3725 (1991) Request this article
