| Reference |
P.A. Stolk, S. Roorda, L. Calcagnile, W.C. Sinke, H.B. van Linden van den Heuvell and F.W. Saris: Structural defects in amorphous silicon probed by sub-picosecond photocarrier dynamics In: Kinetics of Phase Transformations : Symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A. /ed. M.O. Thompson, M.J. Aziz and G.B. Stephenson, Materials Research Society, 1992. - pp. 15-20 |
