Structural and electrical defects in amorphous silicon probed by positrons and electrons Back to all publications Publication date 1 January 1992 Reference S. Roorda, R.A. Hakvoort, A. van Veen, P.A. Stolk and F.W. Saris, Structural and electrical defects in amorphous silicon probed by positrons and electrons, J. Appl. Phys. 72, 5145-5152 (1992) Request this article
