Stress map for ion irradiation: depth-resolved dynamic competition between radiation-induced viscoelastic phenomena in SiO2 Back to all publications Publication date 1 January 2004 DOI http://dx.doi.org/10.1063/1.1773927 Reference T. van Dillen, M.Y.S. Siem and A. Polman, Stress map for ion irradiation: depth-resolved dynamic competition between radiation-induced viscoelastic phenomena in SiO2, Appl. Phys. Lett. 85, 389-391 (2004) Group Photonic Materials “” Request this article
