Spatially-resolved TOF-MS analysis of paint materials and easel paintings samples Back to all publications Publication date 1 January 2001 Reference N. Wyplosz, M.C. Duursma, J.J. Boon and R.M.A. Heeren: Spatially-resolved TOF-MS analysis of paint materials and easel paintings samples In: Advances in Mass Spectrometry; Vol. 15 /ed. E. Gelpi, Weinheim: Wiley, 2001. - pp. 883-884 “” Request this article
