Silicon surface studies by means of proton backscattering and proton induced x-ray emission Back to all publications Publication date 1 January 1973 Reference W.F. van der Weg, W.H. Kool, H.E. Roosendaal and F.W. Saris, Silicon surface studies by means of proton backscattering and proton induced x-ray emission, Radiat. Eff. 17, 245-252 (1973)
