| Reference |
H. van Brug, M.J. van der Wiel, R. van der Pol, J. Verhoeven, G. van der Laan and J.B. Goedkoop, Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings, J. Vac. Sci. Technol. A 6, 2182-2187 (1988) |
