• M.S. van den Berg, Theory on a partially ionized gas centrifuge, Delft University of Technology, 1982-04-15

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  • G.J. Louter, An ultra-sensitive instrument for collision activated dissociation mass spectrometry with high mass resolution, Delft University of Technology, 1982-02-23

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  • R.G. Smeenk, Relaxation, reconstruction and oxidation of nickel surfaces, Utrecht University, 1982-02-22

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  • H. Westendorp, Z.L. Wang and F.W. Saris, Ion beam mixing of Cu-Au and Cu-W systems, Nucl. Instrum. Methods Phys. Res. 194, 453-456 (1982)

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  • T. de Jong, L. Smit, R.M. Tromp and F.W. Saris, Laser processing of UHV-deposited thin silicon films, Appl. Surf. Sci. 10, 10-20 (1982)

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  • F.W. Saris, Ion beam crystallography of surfaces and interfaces, Nucl. Instrum. Methods Phys. Res. 194, 625-632 (1982)

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  • R.A. Haring, F.W. Saris and A.E. de Vries, Mass and energy distribution of particles sputter etched from Si in a XeF2 environment, Appl. Phys. Lett. 41, 174-175 (1982)

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  • B. Rasser, J.N.M. van Wunnik and J.H. Los, Theoretical models of the negative ionization of hydrogen on clean tungsten, cesiated tungsten and cesium surfaces at low energies, Surf. Sci. 118, 697-710 (1982)

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  • H.-N. Chen and A.J.H. Boerboom, A new electrostatic analyser for wide beams and its ion-optical properties, Int. J. Mass Spectrom. Ion Phys. 44, 117-127 (1982)

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  • D. Hoonhout and F.W. Saris, Dopant redistribution by pulsed-laser annealing of ion-implanted silicon, Radiat. Eff. 66, 43-59 (1982)

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