G.J. Louter, An ultra-sensitive instrument for collision activated dissociation mass spectrometry with high mass resolution, Delft University of Technology, 1982-02-23
R.A. Haring, F.W. Saris and A.E. de Vries, Mass and energy distribution of particles sputter etched from Si in a XeF2 environment, Appl. Phys. Lett. 41, 174-175 (1982)
B. Rasser, J.N.M. van Wunnik and J.H. Los, Theoretical models of the negative ionization of hydrogen on clean tungsten, cesiated tungsten and cesium surfaces at low energies, Surf. Sci. 118, 697-710 (1982)
H.-N. Chen and A.J.H. Boerboom, A new electrostatic analyser for wide beams and its ion-optical properties, Int. J. Mass Spectrom. Ion Phys. 44, 117-127 (1982)