Publications

E. Vlieg, X-ray scattering from semiconductor surfaces and interfaces, Leiden University, 1988-09-27

W.J. van der Zande, Energy redistribution in the dissociation of low Rydberg states of HeH of O2, University of Amsterdam, UvA, 1988-08-24

M.E.M. Spruit, Probing gas-surface interactions with a molecular beam, University of Amsterdam, UvA, 1988-06-22

W. Koot, Probing of low Rydberg state wavefunctions in H2, University of Amsterdam, UvA, 1988-04-20

R. Hoogerbrugge, Internal energy of sputtered and vapour phase molecules, University of Amsterdam, UvA, 1988-03-23

A.E.M.J. Fischer, Silicides on silicon: thin-film reaction and interface structure, Leiden University, 1988-03-23

J.H.M. Bonnie, P.J. Eenshuistra and H.J. Hopman, Rotational temperatures and densities of metatstable H2 in a multicusp ion source, Phys. Rev. A 37, 4407-4414 (1988)

D. Frenkel, A.J. Kil, B.M. van der Doef and R.J.J. Zijlstra, Monte Carlo simulation of carrier number noise spectra in the integral quantum Hall regime, J. Phys. C 21, 177-183 (1988)

P.M.J. Marée and J.F. van der Veen: Ion-scattering analysis of semiconductor films In: Application of Ion Beams in Materials Science : Proceedings of the 12th International Symposium of Hosei University, Tokyo, Japan, Sept. 2-4, 1987 /ed. T. Sebe and Y. Yamamoto, Hosei University Press, 1988. - pp. 67-75

R. Hoogerbrugge, M. Bobeldijk, P.G. Kistemaker and J.H. Los, The internal energy of sputtered glycerol molecules, determined by photoionization mass spectrometry, J. Chem. Phys. 88, 5314-5322 (1988)