M. van der Voort, C.W. Rella, A.F.G. van der Meer, A.V. Akimov and J.I. Dijkhuis, Free-electron laser experiments on Si-H vibrations in a-Si: H, J. Lumin. 83-84, 183-186 (1999)
J. van der Weerd, N. Wyplosz, P. Noble, J. Wadum, S. Bryan, A. Belu, J.J. Boon and R.M.A. Heeren: Mass spectrometric examination of the surface of an embedded paint cross-sectionIn: Proceedings of the 47th ASMS conference on Mass Spectrometry and Allied Topics, Dallas, Texas, June 13-17, 1999, ASMS, 1999. - pp. 980-981
H.J. Hopman, J. Verhoeven, P.K. Bachmann, H. Wilson and R. Kroon, Secondary electron emission measurements on synthetic diamond films, Diamond Relat. Mater. 8, 1033-1038 (1999)
J.J. Boon and G.A. van der Doelen: Advances in the current understanding of aged dammar and mastic triterpenoid varnishes on the molecular levelIn: Firnis : Material - Ãsthetik - Geschichte, Internationales Kolloquium, Braunschweig, 15.-17. Juni 1998 = Varnish : Material - Aesthetics - History, International Colloquium, Braunschweig, 15-17 June 1998 /ed. A. Harmssen, Herzog-Anton-Ulrich-Museum, 1999. - pp. 92-103
M. Kamaratos, C.A. Papageorgopoulos, D.C. Papageorgopoulos, D. Tonti, C. Pettenkofer and W. Jaegermann, Cesium deintercalation by Li or Na deposited on 1T-TaSe2 (001) surfaces, Appl. Surf. Sci. 147, 101-106 (1999)