Publications

L.D. Noordam and F. Robicheaux: Dynamics of autoionizing Rydberg atoms in an electric field In: Atomic Physics 16 : Sixteenth International Conference on Atomic Physics, Windsor, Ontario, Canada August 1998 /ed. W.E. Baylis and G.W. Drake, American Institute of Physics, 1998. - pp. 197-208

J.A. Heimberg and J.W.M. Frenken, Feit en fictie over frictie, NTvN 64, 3-7 (1998)

A. Phenix, Solubility parameters and the cleaning of paintings: an update and review, Z. Kunsttechnol. Konserv. 12, 387-409 (1998)

J.P.K. Doye and D. Frenkel, Mechanism of thickness determination in polymer crystals, Phys.Rev.Lett. 81, 2160-2163 (1998)

A. Polman, S. Coffa and R. Soref: Materials and Devices for Silicon-Based OptoelectronicsPittsburgh: MRS, 1998. (Materials Research Society Symposium Proceedings;)

I. Pastorova, T.L. Weeding and J.J. Boon, 3-Phenylpropanylcinnamate, a copolymer unit in Siegburgite fossil resin: A proposed marker for the Hammamelidaceae, Org. Geochem. 29, 1381-1393 (1998)

S. Acco, D.L. Williamson, S. Roorda, W.G.J.H.M. van Sark, A. Polman and W.F. van der Weg, Structural defects and hydrogen clustering in amorphous silicon, J. Non-Cryst. Solids 227-230, 128-132 (1998)

A.W. Kleyn, M. de Voigt and C. van Weert, Aanzet tot een nieuw NNV-beleid, NTvN 64, 189-190 (1998)

M.L. Brongersma, K.S. Min, E. Boer, T. Tambo, A. Polman and H.A. Atwater: Tailoring the optical properties of Si nanocrystals in SiO2: Materials issues and nanocrystal laser perspectives In: Materials and Devices for Silicon-Based Optoelectronics : Symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A. /ed. A. Polman, S. Coffa and R. Soref, Pittsburgh: MRS, 1998. - pp. 213-218

M.A. Gleeson, W.R. Koppers, K. Tsumori and A.W. Kleyn: Negative ion yields in hydrogen scattering from graphite surfaces In: Production and Neutralization of Negative Ions and Beams: Eight International Symposium / Production and Application of Light Negative Ions: Seventh European Workshop : A joint meeting /ed. C. Jacquot, The American Institute of Physics, 1998. - pp. 37-40