| Reference |
M.P. Bruijn, J. Verhoeven, E.J. Puik and M.J. van der Wiel: Multilayer X-ray mirrors; The state of the art In: X-ray Multilayers for Diffractometers, Monochromators, and Spectrometers : 17-19 August 1988, San Diego, California /ed. F.E. Christensen, The International Society for Optical Engineering, 1988. - pp. 54-63 |
