| Reference |
E.J. Puik, M.J. van der Wiel and J. Verhoeven: Layered synthetic multilayers for high resolution X-ray reflection in the 6 to 8 keV region In: X-ray Multilayers for Diffractometers, Monochromators, and Spectrometers : 17-19 August 1988, San Diego, California /ed. F.E. Christensen, The International Society for Optical Engineering, 1988. - pp. 111-118 |
